Invited: Holographic Principles in Antenna Metrology at Millimeter and Submillimeter Wavelengths
Antti V. Räisänen
Aalto University, Finland
Abstract
Holographic principles used in antenna metrology at millimeter and submillimeter wavelengths are discussed. Holographic principles may be applied, e.g., in determining the surface accuracy of large reflectors, in phase retrieval in near-field antenna measurements, in antenna pattern retrieval through input reflection coefficient measurement with reflective load in near-field, or in producing the plane wave conditions for the measurement (a hologram based compact antenna test range).
CV
Antti V. Räisänen is professor of radio engineering at Aalto University, Espoo, Finland since 1987. He has been a Visiting Scientist and Professor with the Five College Radio Astronomy Observatory and the Univ. of Massachusetts at Amherst, USA; Chalmers University of Technology, Sweden; Univ. of California at Berkeley, USA; Jet Propulsion Laboratory and California Institute of Technology, USA; Observatoire de Paris and Universite de Paris 6, and Universidad Carlos III de Madrid. He supervises research in millimeter-wave components, antennas, receivers, microwave measurements, etc., at the Aalto University School of Electrical Engineering, Dept. of Radio Science and Engineering and Millimetre Wave Laboratory of Finland - ESA External Laboratory (MilliLab). He has authored or co-authored some 500 scientific or technical papers and six books, e.g., Radio Engineering for Wireless Communication and Sensor Applications (Artech House, 2003). Dr. Räisänen is Fellow of IEEE since 1994 and Fellow of the Antenna Measurement Techniques Association (AMTA) since 2008. He was the recipient of the AMTA Distinguished Achievement Award in 2009.